• DocumentCode
    3595644
  • Title

    The effect of the specific inherent optical properties on assessing water quality in Dutch inland waters using matrix inversion

  • Author

    Pasterkamp, R. ; Dekker, A.G. ; Hoogenboom, H.J. ; Rijkeboer, M. ; Hakvoort, J.H.M.

  • Author_Institution
    Inst. for Environ. Studies, Vrije Univ., Amsterdam, Netherlands
  • Volume
    4
  • fYear
    1999
  • fDate
    6/21/1905 12:00:00 AM
  • Firstpage
    2095
  • Abstract
    Optical remote sensing is increasingly being used to detect and monitor optical water quality aspects of lakes, rivers and coastal waters. The optical models that are used for water quality retrieval need specific inherent optical properties (SIOPs) as input. However, these SIOPs may be variable between water type. In this paper, SIOPs averaged for Dutch rivers and shallow lakes were selected. Using a relatively simple optical model the effect of the variation in SIOPs on the modelled subsurface reflectance is investigated for a clear and turbid water case. Significant differences were seen between rivers and shallow lakes. Investigation of the inversion of the used optical model showed that errors in the retrieved concentrations introduced due to variability in the SIOPs can be up to 50%. This demonstrates the need for the accurate determination of the SIOPs for use in optical models, and the need for the flexibility of inversion methods to use different sets of SIOPs
  • Keywords
    hydrological techniques; remote sensing; water pollution measurement; Dutch inland waters; Holland; The Netherlands; hydrology; lakes; matrix inversion; measurement technique; remote sensing; river; specific inherent optical properties; water pollution; water quality; Electromagnetic wave absorption; Lakes; Light scattering; Optical attenuators; Optical filters; Optical scattering; Optical sensors; Pigments; Rivers; Water;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 1999. IGARSS '99 Proceedings. IEEE 1999 International
  • Print_ISBN
    0-7803-5207-6
  • Type

    conf

  • DOI
    10.1109/IGARSS.1999.775042
  • Filename
    775042