DocumentCode :
3595733
Title :
Interdependence of readout positions (X, Y) for two dimensional patterned position sensitive detectors
Author :
Javanmardi, F. ; Matoba, M. ; Sakae, T. ; Uozumi, Y.
Author_Institution :
Dept. of Nucl. Eng., Amirkabir Univ. of Technol., Tehran, Iran
Volume :
1
fYear :
1998
fDate :
6/20/1905 12:00:00 AM
Firstpage :
584
Abstract :
Any dependence of the readout positions (X) to the source vertical displacements (Y) for one dimensional position sensing results in extremely unusual phenomenon for 2D position sensing. In this paper the dependence and the problems based on the dependence is studied for position sensing methods. It is shown that severe dependence exists for one dimensional position sensing using patterned cathodes and the applications of this method must be reviewed for 2D position sensing. Many problems such as resolution degradation, double peak readout, “S” type image distortion and centroid shift for 2D position sensitive detectors are based on this unknown phenomenon. Almost all the patterns, such as the wedge-and-strip, backgammon, chevron and diamond patterns have the dependence along the wedged part. For this part the deviation due to the source vertical displacements varies with the source horizontal positions. This deviation has a maximum value (about 10% of the full length) at the center of the pattern. Using the patterned-cathodes with MWPC (multiwire proportional counters) for 2D position sensing is possible if the wire spacing is a multiple of the single pattern width. Also, these cathodes can be used for two dimensional position sensing, without any limitation, if the readout position in the other dimension is done using drift times of the primary electrons
Keywords :
multiwire proportional chambers; position sensitive particle detectors; 1D position sensing; MWPC; backgammon pattern; centroid shift; chevron pattern; diamond pattern; double peak readout; image distortion; multiwire proportional counters; patterned 2D position sensitive detectors; patterned cathodes; readout positions interdependence; resolution degradation; source vertical displacements; wedge-and-strip pattern; Anodes; Cathodes; Counting circuits; Electrodes; Java; Microchannel; Noise level; Position sensitive particle detectors; Strips; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium, 1998. Conference Record. 1998 IEEE
ISSN :
1082-3654
Print_ISBN :
0-7803-5021-9
Type :
conf
DOI :
10.1109/NSSMIC.1998.775209
Filename :
775209
Link To Document :
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