Title :
An impact of circuit scale on the performance of 3-D stacked arithmetic units
Author :
Tada, Jubee ; Egawa, Ryusuke ; Kobayashi, Hiroaki
Author_Institution :
Grad. Sch. of Sci. & Eng., Yamagata Univ., Yonezawa, Japan
Abstract :
Recently, the 3-D stacked integrated circuit technology has been expected to overcome the limitations in the design of the 2-D implemented microprocessors. This paper examines the potential of 3-D integration in design and implementation of large-scale arithmetic units. In this paper, 3-D stacked parallel multipliers with various operand sizes are designed, and the effect of circuit scale on the performance of 3-D stacked multipliers is discussed. In the design of a large-scale parallel multiplier, a lot of through-silicon-vias are required by the conventional partitioning pattern. This paper proposes a partitioning pattern suitable for a large-scale 3-D stacked parallel multiplier. The proposed partitioning pattern aims to reduce the number of TSVs with a large-scale parallel multiplier. Based on the proposed partitioning pattern, 3-D stacked 32, 64, and 128-bit multipliers are designed and evaluated. The proposed partitioning pattern achieves a 13.4% reduction in critical path delay and a 10.4% reduction in power consumption compared to the 2-D implementation, in the case of an 128-bit four-layer implemented 3-D stacked multiplier.
Keywords :
multiplying circuits; three-dimensional integrated circuits; 3D integration; 3D stacked integrated circuit technology; TSV; four-layer implemented 3D stacked multiplier; large-scale 3D stacked parallel multiplier; large-scale arithmetic units; partitioning pattern; storage capacity 128 bit; storage capacity 32 bit; storage capacity 64 bit; through-silicon-vias; Delays; Microprocessors; Power demand; Three-dimensional displays; Through-silicon vias; Wires;
Conference_Titel :
3D Systems Integration Conference (3DIC), 2014 International
DOI :
10.1109/3DIC.2014.7152185