Title :
How do we know if a structure function is correct?
Author :
Szalai, Albin ; Sz?©kely, Vladim?r
Author_Institution :
Dept. of Electron Devices, Budapest Univ. of Technol. & Econ. (BME), Budapest, Hungary
Abstract :
This paper deals with the verification of thermal transient evaluation implementations. This subject is important because eg. the upcoming standard will describe the thermal transient measurement as a standard method to estimate the junction-to-case thermal resistance, thus anybody can create their own implementation of the evaluation method. We have to have a method to verify these implementations. For this reason we examined the result of the NID method from different angles. For these examinations we defined a multilayer structure as a reference structure and we analytically expressed the unit-step response and the cumulative structure function of this structure. Using the unit-step response as an input data set for the implementation in question we got an approximation of the structure function. Analyzing this and the reference RC network we could define a practical maximum tolerance for the deviation between the analytical and the calculated functions.
Keywords :
fault tolerance; lumped parameter networks; reference circuits; standards; thermal resistance; time-domain analysis; NID method; RC network; junction-to-case thermal resistance; maximum tolerance; multilayer structure; reference structure; standard method; structure function; thermal transient measurement; unit-step response; Equations; Impedance; Mathematical model; Publishing; Thermal resistance; Transient analysis;
Conference_Titel :
Thermal Investigations of ICs and Systems (THERMINIC), 2010 16th International Workshop on
Print_ISBN :
978-1-4244-8453-9