Title :
Automated system for the measurement of diode detector parameters in millimetre wavelength range
Author :
Vaks, V.L. ; Daniltsev, V.M. ; Maslovsky, A.V. ; Murel, A.V. ; Khrykin, O.I. ; Chechenin, Y.I. ; Shashkin, V.I.
Author_Institution :
Inst. for Phys. of Microstructures, Acad. of Sci., Nizhny Novgorod, Russia
Abstract :
An automated system for measurement of the basic electrical parameters of waveguide detectors for the 2.4-3 mm wavelength range over a wide range of diode currents and the input radiation power is described. The measured parameters of low-barrier diodes created on the basis of application of delta InGaAs-GaAs are given as an example.
Keywords :
III-V semiconductors; Schottky diodes; automatic test equipment; electric current; gallium arsenide; indium compounds; millimetre wave detectors; millimetre wave diodes; millimetre wave measurement; millimetre wave receivers; semiconductor device measurement; 2.4 to 3 mm; InGaAs-GaAs; InGaAs-GaAs Schottky barrier diodes; automated measurement system; diode current; diode detector parameters; electrical parameters; input radiation power; low-barrier diodes; measured parameters; millimetre wavelength range; waveguide detectors;
Conference_Titel :
Microwave and Telecommunication Technology, 2001. CriMiCo 2001. 11th International Conference on
Print_ISBN :
966-7968-00-6
