Title :
Modeling of Gaussian beam diffraction from a thick single-slit perfectly conducting screen: finite-difference time-domain method vs. rigorous theory
Author :
Alvarez-Cabanillas, M.A. ; Rong-Chung Tyan ; Fainman, Y.
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., San Diego, La Jolla, CA, USA
Abstract :
We model the diffraction of incident beams with Gaussian and constant spatial profiles on a thick single-slit perfectly conducting screen. Slit sizes larger and smaller than the wavelength are considered. We calculate the diffraction patterns using the finite-difference time-domain method and compare the results to those obtained by rigorous theory. The results are in good agreement in both cases.
Keywords :
electromagnetic wave diffraction; finite difference time-domain analysis; Gaussian beam diffraction; constant spatial profiles; finite-difference time-domain method; incident beams; rigorous theory; slit sizes; thick single-slit perfectly conducting screen; Conductivity; Discrete Fourier transforms; Electromagnetic diffraction; Electromagnetic propagation; Electromagnetic scattering; Finite difference methods; Integral equations; Maxwell equations; Optical reflection; Time domain analysis;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1999. IEEE
Print_ISBN :
0-7803-5639-x
DOI :
10.1109/APS.1999.788323
