DocumentCode
3598112
Title
Moment method simulation of rough surface scattering based on wavelet representation
Author
Tzeng, Y.C. ; Chen, K.S. ; Huang, H.
Author_Institution
Dept. of Electron. Eng., Lien-Ho Junior Coll. of Technol. & Commerce, Taiwan
Volume
2
fYear
34881
Firstpage
1448
Abstract
The electromagnetic wave scattering from randomly rough surfaces is studied by means of moment method using the wavelets to represent the surface tangential fields or currents. Conventional moment method usually forms the matrix by uniform sampling. Since the density of the surface currents is dependent on the roughness of the surface, or more precisely the surface local slope. As a result, the matrix usually is densely distributed. When the surface becomes rougher or wavelength is larger, the size of the matrix is extremely large which is computational prohibitive. By making use of the wavelet expansion, due to its highly localized and adaptive sampling properties, the pattern and size of the resulting matrix can be accordingly adjusted. This merit is especially well suited for the simulation of rough surface scattering, particularly in the problems of three dimensional surfaces. In this study, the authors adopt the orthonormal and compactly supported wavelets proposed by Daubechies. The dependence of the number of coefficients on surface roughness, correlation function and wavelength are investigated. Then the validity and performance of the proposed approach is evaluated and tested on a broad range of parameters
Keywords
S-matrix theory; backscatter; electromagnetic wave scattering; geophysical techniques; radar cross-sections; radar theory; remote sensing by radar; wavelet transforms; S-matrix; backscatter; electromagnetic wave scattering; geophysical measurement technique; land surface; moment method simulation; orthonormal compactly supported wavelet; radar scattering; randomly rough surface; rough surface EM scattering theory; scattering matrix; terrain mapping; three dimensional surface; wavelet representation; Computational modeling; Electromagnetic scattering; Integral equations; Matrix converters; Moment methods; Multiresolution analysis; Rough surfaces; Sampling methods; Surface roughness; Surface waves; Testing; Wavelet analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium, 1995. IGARSS '95. 'Quantitative Remote Sensing for Science and Applications', International
Print_ISBN
0-7803-2567-2
Type
conf
DOI
10.1109/IGARSS.1995.521776
Filename
521776
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