Title :
Simulation of commutation signaling to combat ISI
Author :
Correia, Am?©rico M C
Author_Institution :
Dept. de Engenharia Electrotecnica e de Comput., Inst. Superior Tecnico, Lisbon, Portugal
Abstract :
Broadband millimeter wave communication systems envisaged to provide high data rate links between mobile, personal and remote terminals in indoor and outdoor scenarios, were considered in RACE R2067 Mobile Broadband System. The work presented in this paper refers to this RACE project. A TDMA system with bandwidth expanding signaling, where the multipath induced intersymbol interference (ISI) predominates is presented. The bit error rate (BER) performance of noncoherent DBPSK and π/4-DQPSK with multipath diversity, performed by different multipath combiners (namely the RAKE receiver with equal gain combining and the postdetection integrator), for outdoor/indoor multipath Nakagami fading channels is evaluated
Keywords :
coding errors; differential phase shift keying; digital simulation; diversity reception; error statistics; fading; indoor radio; intersymbol interference; land mobile radio; multipath channels; quadrature phase shift keying; radiofrequency interference; simulation; telecommunication signalling; time division multiple access; π/4-DQPSK; BER performance; RACE R2067 Mobile Broadband System; RACE project; RAKE receiver; TDMA system; bandwidth expanding signaling; bit error rate; broadband millimeter wave communication; commutation signaling; equal gain combining; high data rate links; indoor radio; mobile terminals; multipath Nakagami fading channels; multipath combiners; multipath diversity; multipath induced intersymbol interference; noncoherent DBPSK; personal terminals; remote terminals; simulation; Bandwidth; Bit error rate; Broadband communication; Diversity reception; Fading; Intersymbol interference; Millimeter wave communication; Multipath channels; Performance evaluation; Time division multiple access;
Conference_Titel :
Spread Spectrum Techniques and Applications Proceedings, 1996., IEEE 4th International Symposium on
Print_ISBN :
0-7803-3567-8
DOI :
10.1109/ISSSTA.1996.563771
