DocumentCode :
3598188
Title :
Transport characterizations and diodelike behaviour of Mn0.98CR0.02Te film prepared by pulsed laser deposition
Author :
Yang, L. ; Wang, Z. ; Zhang, Z.
Author_Institution :
Inst. of Metal Res., Shenyang, China
fYear :
2015
Firstpage :
1
Lastpage :
1
Abstract :
MnTe is a kind of antiferromagnetic semiconductor with Néel temperature (TN) of 307 K. Mn1-xCrxTe was investigated as diluted magnetic semiconductor. The structure, magnetic and transport properties of MnTe and Mn1-xCrxTe films were investigated . In these previous works, some of the films represent different characteristic from the bulk ones, such as ferromagnetism at room temperature and the anomaly of resistivity below TN. Diodelike behavior is usually observed in semiconductor/metal systems because of forming p-n junctions, such as in glass-metal nanocomposite, due to the presence of metal-semiconductor junctions in the glasses, in which the metal particles of diameter about 2 nm behave as semiconductors. The diodelike behavior also was found in Si nanowires due to nonuniform composite. In this work, the Mn0.98Cr0.02Te films with island growth were prepared by pulsed laser deposition (PLD) . The transport properties were studied from 300 to 2 K, and a transformation from metal to semiconductor was found at about 220 K, which is shifted with changing measurement current . And a diodelike behavior was discovered near the transformation temperature.
Keywords :
chromium compounds; electrical resistivity; manganese compounds; metal-insulator transition; pulsed laser deposition; semiconductor growth; semiconductor thin films; semimagnetic semiconductors; Mn0.98Cr0.02Te; Neel temperature; antiferromagnetic semiconductor; diluted magnetic semiconductor; diodelike behaviour; island growth; metal-semiconductor transformation temperature; pulsed laser deposition; temperature 300 K to 2 K; thin film; transport characterizations; Conductivity; Films; Metals; Semiconductor device measurement; Semiconductor diodes; Temperature; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference (INTERMAG), 2015 IEEE
Print_ISBN :
978-1-4799-7321-7
Type :
conf
DOI :
10.1109/INTMAG.2015.7156779
Filename :
7156779
Link To Document :
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