• DocumentCode
    3598208
  • Title

    Automatic bipolar transistor characterisation

  • Author

    Brown, D.J. ; Moffat, N.M.J.

  • Author_Institution
    Plessey Research Caswell Ltd., Towcester, UK
  • fYear
    1988
  • fDate
    4/19/1988 12:00:00 AM
  • Firstpage
    42522
  • Lastpage
    42530
  • Abstract
    Discusses the optimisation of SPICE parameters from the BJT model to measured data in order to improve the characterisation of Bipolar Junction Transistors. Initial work was restricted to DC analysis but now includes AC analysis as well. After measuring the data, it is input to a program called ANALYSE which extracts an initial set of parameters to describe the device in question. These parameters are then optimised by a program called BTEX, leaving a set of parameters which characterises the device
  • Keywords
    bipolar transistors; circuit CAD; semiconductor device models; AC analysis; ANALYSE; BJT model; BTEX; Bipolar Junction Transistors; DC analysis; SPICE parameters; optimisation;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Large Signal Device Models and Parameter Extractions for Circuit Simulation, IEE Colloquium on
  • Type

    conf

  • Filename
    209090
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3598208