3598558

Ultra Low Power 16K CMOS RAM

Tanaka, T. ; Shimizu, H. ; Takaishi, I. ; Funakoshi, Y. ; Kohno, Y. ; Kashimoto, Y.

Semiconductor Division Mitsubishi Electric Co., 4-1,Mizuhara,Itami,Hyogo 664 Japan

1983

38

39

CMOS process; Circuit noise; Clocks; Delay effects; Large scale integration; Latches; Random access memory; Read-write memory; Timing; Very large scale integration;

English

ieee

VLSI Technology, 1983. Digest of Technical Papers. Symposium on

4-930813-05-0

conf

4480626