DocumentCode
3599123
Title
A solution to relax breakdown threshold in waveguide filters
Author
Frigui, Kamel ; Bila, S. ; Baillargeat, Dominique ; Catherinot, A. ; Verdeyme, S. ; Puech, J. ; Estagerie, Laetitia ; Pacaud, Damien ; Dillenbourg, H.
Author_Institution
XLIM, Univ. de Limoges, Limoges, France
fYear
2012
Firstpage
1107
Lastpage
1110
Abstract
While characterizing OMUX filters at atmospheric pressure, electrical breakdown can occur involuntarily and damage the equipment. The phenomenon of breakdown was studied and our objective was to propose a multi-physical modeling, in order to predict the critical input power which can generate such a microwave breakdown. In this paper we present the microwave breakdown threshold at several frequency bands and we propose a solution to relax the microwave breakdown threshold.
Keywords
atmospheric pressure; electric breakdown; microwave filters; waveguide filters; OMUX filter characterization; atmospheric pressure; critical input power; electrical breakdown; microwave breakdown threshold; multiphysical modeling; waveguide filters; Electric breakdown; Electromagnetic heating; Fasteners; Gold; Microwave filters; Breakdown; Microwave Filters; breakdown threshold; electronic density; electronic temperature; heat diffusion; plasma physics; thermal transfer theory;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference (EuMC), 2012 42nd European
Print_ISBN
978-1-4673-2215-7
Electronic_ISBN
978-2-87487-026-2
Type
conf
Filename
6459200
Link To Document