DocumentCode :
3599439
Title :
Training multilayer perceptrons in the presence of measurement outliers
Author :
Lo, James T. ; Bassu, Devasis
Author_Institution :
Dept. of Math. & Stat., Maryland Univ., Baltimore, MD, USA
Volume :
3
fYear :
2001
fDate :
6/23/1905 12:00:00 AM
Firstpage :
2030
Abstract :
Instead of the robust estimation criteria from statistics, a new training method using a continuum of modified risk-seeking criteria with a negative risk-sensitivity index is proposed for training neural networks with data containing outlying measurement noises. In contrast to the ordinary methods using a fixed training criterion or a fixed annealing schedule for the training criterion in a training session, the new method continues adjusting adaptively the risk-sensitivity index to tune to the measurement outliers for best reducing their effects on the training
Keywords :
learning (artificial intelligence); multilayer perceptrons; simulated annealing; fixed annealing schedule; fixed training criterion; measurement outliers; modified risk-seeking criteria; multilayer perceptron training; negative risk-sensitivity index; neural networks; outlying measurement noises; training session; Annealing; Electronic mail; Mathematics; Multilayer perceptrons; Neural networks; Noise measurement; Noise robustness; Nonhomogeneous media; Processor scheduling; Statistics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Neural Networks, 2001. Proceedings. IJCNN '01. International Joint Conference on
ISSN :
1098-7576
Print_ISBN :
0-7803-7044-9
Type :
conf
DOI :
10.1109/IJCNN.2001.938478
Filename :
938478
Link To Document :
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