• DocumentCode
    3599533
  • Title

    Modeling of a 14-bit, 100-MS/s pipelined ADC with digital nonlinearity calibration

  • Author

    Wang, Xuan ; Chen, Junxiao ; HE, Lenian

  • Author_Institution
    Inst. of VLSI Design, Zhejiang Univ., Hangzhou, China
  • fYear
    2009
  • Firstpage
    208
  • Lastpage
    211
  • Abstract
    This paper describes a digital calibration scheme for pipelined analog-to-digital converters (ADCs). The proposed method corrects the nonlinearity caused by finite gain and bandwidth of interstage operational amplifiers as well as the capacitors mismatch in multiplying digital-to-analog converters. The proposed calibration technique takes the advantages of both foreground and background calibration schemes. A behavior simulation is carried out to verify the proposed calibration scheme. Simulation results revealed that for a 14 bit, 100 MS/s pipelined ADC with 0.1% capacitor mismatch, the INL could be limited within ±1.2 LSB and a 76.8 dB SNDR is achieved, due to proposed digital calibration technique.
  • Keywords
    analogue-digital conversion; calibration; digital-analogue conversion; operational amplifiers; background calibration schemes; capacitors mismatch; digital calibration scheme; digital nonlinearity calibration; digital-to-analog converters; foreground calibration schemes; interstage operational amplifiers; pipelined ADC modelling; pipelined analog-to-digital converters; Analog-digital conversion; Calibration; Capacitors; Helium; MOS devices; Operational amplifiers; Pipelines; Sampling methods; Very large scale integration; Voltage; Pipelined ADC; digital calibration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Circuits, ISIC '09. Proceedings of the 2009 12th International Symposium on
  • Print_ISBN
    978-9-8108-2468-6
  • Type

    conf

  • Filename
    5403719