• DocumentCode
    3599566
  • Title

    A 5-Gb/s 1/8-rate CMOS clock and data recovery circuit

  • Author

    Kwon, Jin Kyu ; Heo, Tae Kwan ; Cho, Sang-Bock ; Park, Sung Min

  • Author_Institution
    Sch. of Electr. Eng., Ulsan Univ., South Korea
  • Volume
    4
  • fYear
    2004
  • Abstract
    A 5-Gb/s clock and data recovery (CDR) circuit, incorporating 625 MHz interpolating voltage-controlled oscillators (VCO) and four-phase 1/8-rate phase detectors (PD), is demonstrated. The PD provides a linear characteristic that is proportional to the phase difference between the four-phase clocks and the input 5-Gb/s data, and hence produces four-demultiplexed 1.25-Gb/s outputs. The VCO is designed as a four-stage differential ring oscillator, employing the half-rate clock technique so that it can provide 1/8-rate clocks with delay interpolation. Test chips are fabricated in a 0.25 μm CMOS technology. The whole chip occupies an area of 1.7×1.4 mm2 together with on-chip low pass filters, i.e., two 16 pF capacitors and 63 kΩ resistors. Post-layout simulations show that the recovered data output exhibits 40psp-p jitter characteristic for 223-1 PRBS serial NRZ input. The chip core dissipates 130 mW from a single 2.5 V supply.
  • Keywords
    CMOS integrated circuits; capacitors; delay filters; demultiplexing; jitter; low-pass filters; optical communication; phase detectors; phase locked loops; resistors; synchronisation; voltage-controlled oscillators; 0.25 micron; 1.25 Gbit/s; 130 mW; 16 pF; 2.5 V; 40 ps; 5 Gbit/s; 625 MHz; 63 kohm; CMOS clock circuit; capacitors; chip core; chip testing; clock data recovery circuit; complementary metal-oxide-semiconductor clock; delay interpolation; demultiplex; four-phase clocks; four-stage differential ring oscillator; half-rate clock method; jitter; on-chip low pass filters; phase detectors; phase difference; post layout simulations; resistors; serial nonreturn to zero input; voltage-controlled oscillators; CMOS technology; Circuits; Clocks; Delay; Detectors; Interpolation; Phase detection; Ring oscillators; Testing; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2004. ISCAS '04. Proceedings of the 2004 International Symposium on
  • Print_ISBN
    0-7803-8251-X
  • Type

    conf

  • DOI
    10.1109/ISCAS.2004.1328998
  • Filename
    1328998