DocumentCode :
3600978
Title :
Automated Technology Migration Methodology for Mixed-Signal Circuit Based on Multistart Optimization Framework
Author :
Liuxi Qian ; Zhaori Bi ; Dian Zhou ; Xuan Zeng
Author_Institution :
Dept. of Electr. Eng., Univ. of Texas at Dallas, Richardson, TX, USA
Volume :
23
Issue :
11
fYear :
2015
Firstpage :
2595
Lastpage :
2605
Abstract :
Optimization-simulation loop-based method is popular and efficient in design migration/reuse automation. However, it is only restricted to be used in block-level due to the complexity of current mixed-signal system. This paper presents a hierarchical methodology for efficiently migrating mixed-signal circuit design from one technology node to another, while keeping the same circuit and layout topologies. It utilizes two stages of optimization processes to automatically resize and refine device dimensions in target technology. In the first stage, to avoid the costly simulation time without scarifying systematical functionality, only one block is represented in transistor level (TL), while other blocks are replaced with behavioral models. The multistart global optimization technique is applied to resize the TL block in systematic connection. This stage provides a good initial point for next system-level refinement. Moreover, for obtaining a process and parasitic closure solution, both parasitic and process variation effects are explored and used to constrain the schematic migration. A representative mixed-signal system, charge-pump phase-locked loop, is used to validate the proposed methodology. The experimental results show that the proposed methodology efficiently generates quality designs in target technology with much less simulation iterations, when comparing with recent available approaches.
Keywords :
charge pump circuits; mixed analogue-digital integrated circuits; optimisation; phase locked loops; TL block; automated technology migration methodology; behavioral model; charge-pump phase-locked loop; current mixed-signal system; device dimension; migration automation; mixed-signal circuit; multistart global optimization technique; multistart optimization framework; optimization-simulation loop-based method; parasitic closure solution; process variation effect; reuse automation; schematic migration; system-level refinement; transistor level; Equations; Hardware design languages; Integrated circuit modeling; Mathematical model; Optimization; Phase frequency detector; Voltage-controlled oscillators; Design reuse; optimization method; phase-locked loop (PLL); technology migration; technology migration.;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2014.2377013
Filename :
6985655
Link To Document :
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