DocumentCode :
3601021
Title :
Tackling Performance Variability Due to RAS Mechanisms with PID-Controlled DVFS
Author :
Rodopoulos, Dimitrios ; Catthoor, Francky ; Soudris, Dimitrios
Author_Institution :
Sch. of Electr. & Comput. Eng., Nat. Tech. Univ. of Athens, Athens, Greece
Volume :
14
Issue :
2
fYear :
2015
Firstpage :
156
Lastpage :
159
Abstract :
As technology nodes approach deca-nanometer dimensions, many phenomena threaten the binary correctness of processor operation. Computer architects typically enhance their designs with reliability, availability and serviceability (RAS) schemes to correct such errors, in many cases at the cost of extra clock cycles, which, in turn, leads to processor performance variability. The goal of the current paper is to absorb this variability using Dynamic Voltage and Frequency Scaling (DVFS). A closed-loop implementation is proposed, which configures the clock frequency based on observed metrics that encapsulate performance variability due to RAS mechanisms. That way, performance dependability and predictability is achieved. We simulate the transient and steady state behavior of our approach, reporting responsiveness within less than 1 ms. We also assess our idea using the power model of real processor and report a maximum energy overhead of roughly 10 percent for dependable performance in the presence of RAS temporal overheads.
Keywords :
closed loop systems; computer architecture; microcomputers; reliability; three-term control; PID-controlled DVFS; RAS mechanisms; availability; binary correctness; closed-loop implementation; computer architects; deca-nanometer dimensions; dynamic voltage and frequency scaling; performance variability; processor operation; reliability; serviceability; Mathematical model; Performance evaluation; Process control; Reliability; Voltage control; Availability and Serviceability; Dynamic Voltage and Frequency Scaling; Dynamic voltage and frequency scaling; Performance Vulnerability Factor; Reliability; availability and serviceability; performance vulnerability factor; reliability;
fLanguage :
English
Journal_Title :
Computer Architecture Letters
Publisher :
ieee
ISSN :
1556-6056
Type :
jour
DOI :
10.1109/LCA.2014.2385713
Filename :
6995941
Link To Document :
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