DocumentCode :
3601209
Title :
Structural Atomic Representation for Classification
Author :
Yuan Yan Tang ; Yulong Wang ; Luoqing Li ; Chen, C. L. Philip
Author_Institution :
Fac. of Sci. & Technol., Univ. of Macau, Macau, China
Volume :
45
Issue :
12
fYear :
2015
Firstpage :
2905
Lastpage :
2913
Abstract :
Recently, a large family of representation-based classification methods have been proposed and attracted great interest in pattern recognition and computer vision. This paper presents a general framework, termed as atomic representation-based classifier (ARC), to systematically unify many of them. By defining different atomic sets, most popular representation-based classifiers (RCs) follow ARC as special cases. Despite good performance, most RCs treat test samples separately and fail to consider the correlation between the test samples. In this paper, we develop a structural ARC (SARC) based on Bayesian analysis and generalizing a Markov random field-based multilevel logistic prior. The proposed SARC can utilize the structural information among the test data to further improve the performance of every RC belonging to the ARC framework. The experimental results on both synthetic and real-database demonstrate the effectiveness of the proposed framework.
Keywords :
Bayes methods; Markov processes; pattern classification; Bayesian analysis; Markov random field-based multilevel logistic prior; SARC; atomic representation-based classifier; atomic sets; computer vision; pattern recognition; representation-based classification methods; representation-based classifiers; structural ARC; structural atomic representation; Bayes methods; Classification algorithms; Clustering algorithms; Complexity theory; Databases; Optimization; Vectors; Atomic representation (AR); Bayesian analysis; Markov random field (MRF); greedy coordinate descent; subspace;
fLanguage :
English
Journal_Title :
Cybernetics, IEEE Transactions on
Publisher :
ieee
ISSN :
2168-2267
Type :
jour
DOI :
10.1109/TCYB.2015.2389232
Filename :
7018039
Link To Document :
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