• DocumentCode
    3601305
  • Title

    Adaptive ECC Scheme for Hybrid SSD’s

  • Author

    Jen-Wei Hsieh ; Chung-Wei Chen ; Han-Yi Lin

  • Author_Institution
    Dept. of Comput. Sci. & Inf. Eng., Nat. Taiwan Univ. of Sci. & Technol., Taipei, Taiwan
  • Volume
    64
  • Issue
    12
  • fYear
    2015
  • Firstpage
    3348
  • Lastpage
    3361
  • Abstract
    In recent years, multi-level cell flash memory (MLC) has been widely adopted in solid state drives (SSD´s) as the major storage medium due to its lower cost and higher density, compared with single-level cell flash memory (SLC). However, MLC has reliability concerns since it has lower endurance and higher disturb failure rate. Researchers thus proposed SLC/MLC hybrid SSD to exploit the advantages of SLC and MLC by separating frequently updated data in SLC and seldom modified data in MLC. In this paper, we propose an adaptive error correction code (ECC) scheme with four ECC levels to enhance the reliability of SSD´s. Different from past researches, SLC is dedicated for the management of ECC, not for the user data. Since ECC is maintained in the data area of SLC (2 KB), rather than the spare area of MLC (128 Bytes), ECC capability is no longer confined by the limited size of the spare area. With adaptive management, ECC capability for a page would be upgraded whenever the current ECC cannot guarantee its reliability. A quantitative analysis is conducted to explore the impacts of different settings. The experiment results show that the lifetime of SSD can be extended by 318 percent for the trace of OLTP applications with our adaptive ECC scheme.
  • Keywords
    error correction codes; flash memories; microwave circuits; MLC; SLC/MLC hybrid SSD; adaptive ECC scheme; adaptive error correction code; adaptive management; multilevel cell flash memory; single level cell flash memory; solid state drives; Adaptive systems; Bit error rate; Decoding; Error correction codes; Flash memories; Multimedia communication; Random access memory; Reliability; SLC/MLC hybrid SSD; adaptive ECC scheme; reliability;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.2015.2401028
  • Filename
    7035027