Title :
An Improved
-Band Magnetically Insulated Transmission Line Oscillator
Author :
Tao Jiang ; Jiande Zhang ; Juntao He ; Jinchuan Ju ; Zhiqiang Li ; Junpu Ling
Author_Institution :
Coll. of Optoelectron. Sci. & Eng., Nat. Univ. of Defense Technol., Changsha, China
Abstract :
An improved Ku-band magnetically insulated transmission line oscillator (MILO) was designed and presented in this paper. To eliminate the electrode erosion in the load region, an improved limited load is presented. Theoretical calculations show that both the current density and the energy deposition density of the improved load are much smaller than those of the traditional plane diode load, so the electrode erosion can be eliminated or greatly reduced. An improved coaxial extractor with a gradient inner conductor is introduced to achieve efficient microwave extraction and a single coaxial TEM output. Simulation results show that the right amount of microwave reflection generated by the gradient inner conductor helps to strengthen the oscillation of the resonant cavities and the beam-wave interaction, then enhancing the microwave output efficiency. The improved Ku-band MILO is optimized numerically with a particle-in-cell code. Typical simulation results show that when the input voltage is 450 kV, the beam current is 48 kA, and high-power microwave is produced with an average power of 2.7 GW, an efficiency of 12.5%, and a frequency of 12.5 GHz.
Keywords :
microwave generation; microwave oscillators; Ku-band MILO; coaxial extractor; current 48 kA; efficiency 12.5 percent; electrode erosion; energy deposition density; frequency 12.5 GHz; gradient inner conductor; magnetically insulated transmission line oscillator; power 2.7 GW; single coaxial TEM; voltage 450 kV; Conductors; Current density; Electrodes; Microwave oscillators; Plasmas; Power transmission lines; $K_{u}$ -band; Ku-band; Extractor; improved load; magnetically insulated transmission line oscillator (MILO); particle simulation; particle simulation.;
Journal_Title :
Plasma Science, IEEE Transactions on
DOI :
10.1109/TPS.2015.2411614