• DocumentCode
    3601878
  • Title

    Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model

  • Author

    Chih-Chun Tsai ; Chien-Tai Lin

  • Author_Institution
    Dept. of Math., Tamkang Univ., Taipei, Taiwan
  • Volume
    64
  • Issue
    4
  • fYear
    2015
  • Firstpage
    1340
  • Lastpage
    1355
  • Abstract
    The accelerated destructive degradation test (ADDT) method provides an effective way to assess the reliability information of highly reliable products whose quality characteristics degrade over time, and can be taken only once on each tested unit during the measurement process. Conventionally, engineers assume that the measurement error follows the normal distribution. However, degradation models based on this normality assumption often do not apply in practical applications. To relax the normality assumption, the skew-normal distribution is adopted in this study because it preserves the advantages of the normal distribution with the additional benefit of flexibility with regard to skewness and kurtosis. Here, motivated by polymer data, we propose a skew-normal nonlinear ADDT model, and derive the analytical expressions for the product´s lifetime distribution along with its corresponding 100pth percentile. Then, the polymer data are used to illustrate the advantages gained by the proposed model. Finally, we addressed analytically the effects of model mis-specification when the skewness of measurement error are mistakenly treated, and the obtained results reveal that the impact from the skewness parameter on the accuracy and precision of the prediction of the lifetimes of products is quite significant.
  • Keywords
    life testing; measurement errors; production testing; reliability; ADDT method; degradation models; highly reliable products; kurtosis; lifetime inference; measurement error; measurement process; model misspecification; normality assumption; polymer data; reliability information; skew-normal accelerated destructive degradation test model; skew-normal distribution; skew-normal nonlinear ADDT model; skewness parameter; Computational modeling; Data models; Degradation; Gaussian distribution; Maximum likelihood estimation; Polymers; Stress; Accelerated destructive degradation tests; expectation-maximization algorithm; highly reliable products; model mis-specification; skew-normal distribution;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2015.2419618
  • Filename
    7086103