DocumentCode
3601878
Title
Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model
Author
Chih-Chun Tsai ; Chien-Tai Lin
Author_Institution
Dept. of Math., Tamkang Univ., Taipei, Taiwan
Volume
64
Issue
4
fYear
2015
Firstpage
1340
Lastpage
1355
Abstract
The accelerated destructive degradation test (ADDT) method provides an effective way to assess the reliability information of highly reliable products whose quality characteristics degrade over time, and can be taken only once on each tested unit during the measurement process. Conventionally, engineers assume that the measurement error follows the normal distribution. However, degradation models based on this normality assumption often do not apply in practical applications. To relax the normality assumption, the skew-normal distribution is adopted in this study because it preserves the advantages of the normal distribution with the additional benefit of flexibility with regard to skewness and kurtosis. Here, motivated by polymer data, we propose a skew-normal nonlinear ADDT model, and derive the analytical expressions for the product´s lifetime distribution along with its corresponding 100pth percentile. Then, the polymer data are used to illustrate the advantages gained by the proposed model. Finally, we addressed analytically the effects of model mis-specification when the skewness of measurement error are mistakenly treated, and the obtained results reveal that the impact from the skewness parameter on the accuracy and precision of the prediction of the lifetimes of products is quite significant.
Keywords
life testing; measurement errors; production testing; reliability; ADDT method; degradation models; highly reliable products; kurtosis; lifetime inference; measurement error; measurement process; model misspecification; normality assumption; polymer data; reliability information; skew-normal accelerated destructive degradation test model; skew-normal distribution; skew-normal nonlinear ADDT model; skewness parameter; Computational modeling; Data models; Degradation; Gaussian distribution; Maximum likelihood estimation; Polymers; Stress; Accelerated destructive degradation tests; expectation-maximization algorithm; highly reliable products; model mis-specification; skew-normal distribution;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.2015.2419618
Filename
7086103
Link To Document