Title :
Planning Massive Interconnects in 3-D Chips
Author :
Knechtel, Johann ; Young, Evangeline F. Y. ; Lienig, Jens
Author_Institution :
Inst. of Electromech. & Electron. Design, Dresden Univ. of Technol., Dresden, Germany
Abstract :
3-D chips rely on massive interconnect structures, i.e., large groups of through-silicon vias coalesced with large multibit buses. We observe that wirelength optimization, a classical technique for floorplanning, is not effective while planning massive interconnects. This is due to the interconnects´ strong impact on multiple design criteria like wirelength, routability, and temperature. To facilitate early design progress of massively-interconnected 3-D chips, we propose a novel 3-D-floorplanning methodology which accounts for different types of interconnects in a unified manner. One key idea is to align cores/blocks simultaneously within and across dies, thus increasing the likelihood of successfully implementing complex and massive interconnects. While planning such interconnects, we also target fast, yet accurate, thermal management, routability, and fixed-outline floorplanning. Experimental results on Gigascale Systems Research Center and IBM-HB+ circuits demonstrate our tool´s capabilities for both planning massive 3-D interconnects and for multiobjective 3-D floorplanning in general.
Keywords :
integrated circuit interconnections; integrated circuit layout; three-dimensional integrated circuits; Gigascale Systems Research Center; IBM-HB+ circuits; complex interconnects; cores-blocks; fixed-outline floorplanning; massively-interconnected 3D chips; multibit buses; multiobjective 3D floorplanning; multiple design criteria; thermal management; through-silicon vias; wirelength optimization; Encoding; Integrated circuit interconnections; Layout; Optimization; Planning; Three-dimensional displays; Through-silicon vias; 3-D integration; 3D integration; block alignment; bus planning; floorplanning; massive interconnects; thermal management;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2015.2432141