Title :
Investigation of Nano-Molybdenum Carbide Particle Produced by Wire-Explosion Process
Author :
Sarathi, Ramanujam ; Reddy, Ravula Sugunakar ; Tavarmani, Rashmi S. ; Okamoto, Akira ; Suematsu, Hisayuki ; Selvam, Parasuraman ; Kamachi Mudali, Uthandi ; Kamaraj, Muthusamy
Author_Institution :
Dept. of Electr. Eng., IIT Madras, Chennai, India
Abstract :
Molybdenum carbide (MoC) nanoparticles were generated by exploding molybdenum conductor in methane gas ambience at different pressures. To enhance the level of carburization, exploding conductor was coated with graphite and paraffin mixtures. Various physico-chemical studies were employed to characterize the produced nano-carbide particles, viz., X-ray diffraction, optical emission spectroscopy, X-ray photoelectron spectroscopy, and transmission electron microscopy. It was deduced from these investigations that the nano-MoC particles produced by a wire explosion process (WEP) are spherical in shape. The size of the particles formed by WEP can be controlled by varying the operating ambience pressure of the methane gas. The particle size produced follows a log-normal distribution. Optical emission results clearly indicates the presence of Mo-I, C-I, and C-II components during WEP. X-ray photoelectron spectroscopy confirms the formation of MoC.
Keywords :
X-ray diffraction; X-ray photoelectron spectra; mixtures; molybdenum compounds; nanofabrication; nanoparticles; particle size; transmission electron microscopy; MoC; X-ray diffraction; X-ray photoelectron spectroscopy; graphite; methane gas ambience; nanomolybdenum carbide particle; optical emission spectroscopy; paraffin mixtures; particle size; physico-chemical property; transmission electron microscopy; wire-explosion process; Coatings; Conductors; Explosions; Graphite; Nanoparticles; Stimulated emission; Wires; Log-normal distribution; X-ray diffractogram (XRD); X-ray diffractogram (XRD).; nano-molybdenum carbide (MoC); optical emission spectroscopy (OES); transmission electron microscopy (TEM); wire-explosion process (WEP);
Journal_Title :
Plasma Science, IEEE Transactions on
DOI :
10.1109/TPS.2015.2426019