DocumentCode :
3602725
Title :
A Temperature-Stable Piezoelectric MEMS Oscillator Using a CMOS PLL Circuit for Temperature Sensing and Oven Control
Author :
Zhengzheng Wu ; Rais-Zadeh, Mina
Author_Institution :
Univ. of Michigan, Ann Arbor, MI, USA
Volume :
24
Issue :
6
fYear :
2015
Firstpage :
1747
Lastpage :
1758
Abstract :
In this paper, design, analysis, and implementation of a piezoelectric microelectromechanical systems (MEMS) oscillator on an ovenized microplatform is presented. An oxide-refill process is used to compensate the first-order temperature coefficient of frequency of MEMS resonators, as well as to realize thermal isolation structures. The technology enables fabrication of low-power ovenized device fusion platforms using standard silicon on insulator wafers. Utilizing the intrinsic frequency-temperature characteristic of two MEMS resonators, temperature sensing and closed-loop oven-control is realized by phase-locking two MEMS oscillators at an oven-set temperature. The design of the phase-lock control loop is studied using multidomain linear models. Control loop dynamics, noise properties, and nonideal effects are analyzed. Low-power and low-noise phase-locked loop-based control circuitry is designed in 0.18-μm CMOS to interface with the MEMS resonators. Using the developed technology, an oven controlled MEMS oscillator exhibits an overall frequency drift of <;8 ppm over -40 °C to 70 °C without the need for system calibration. In addition, the MEMS oscillators exhibit near zero phase noise degradation in closed-loop operation.
Keywords :
CMOS integrated circuits; closed loop systems; micromechanical resonators; oscillators; phase locked loops; piezoelectric devices; silicon-on-insulator; temperature sensors; CMOS PLL circuit; MEMS resonators; Si; closed-loop oven-control; control loop dynamics; first-order temperature coefficient; intrinsic frequency-temperature characteristic; low-power ovenized device fusion platforms; microelectromechanical systems; multidomain linear models; noise properties; nonideal effects; oxide-refill process; phase-lock control loop; phase-locked loop-based control circuitry; size 0.18 mum; standard silicon on insulator wafers; temperature sensing; temperature-stable piezoelectric MEMS oscillator; thermal isolation structures; Heating; Micromechanical devices; Oscillators; Phase locked loops; Resonant frequency; Temperature sensors; Thermal resistance; Clock; MEMS resonators; frequency reference; oscillators; phase noise; phase noise.; phase-locked loops (PLLs);
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2015.2434832
Filename :
7116482
Link To Document :
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