DocumentCode
3602966
Title
Reduction of Thermal Resistance and Optical Power Loss Using Thin-Film Light-Emitting Diode (LED) Structure
Author
Huan Ting Chen ; Yuk Fai Cheung ; Hoi Wai Choi ; Siew Chong Tan ; Hui, S.Y.
Author_Institution
Dept. of Electr. & Electron. Eng., Univ. of Hong Kong, Hong Kong, China
Volume
62
Issue
11
fYear
2015
Firstpage
6925
Lastpage
6933
Abstract
In this paper, a GaN light-emitting diode (LED) with sapphire structure and a thin-film LED without sapphire structure are characterized in the photo electrothermal modeling framework for comparison. Starting from the analysis and modeling of internal quantum efficiency as a function of current and temperature of blue LED, this work develops the thin-film LED device model and derives its optical power and the heat dissipation coefficient. The device parameters of the two LED devices with different structural designs are then compared. Practical optical power measurements are compared with theoretical predictions based on the two types of fabricated devices. It is shown that the thin-film LED device has much lower thermal resistance and optical power loss.
Keywords
III-V semiconductors; cooling; gallium compounds; light emitting diodes; optical losses; thermal resistance; wide band gap semiconductors; LED; heat dissipation coefficient; internal quantum efficiency; optical power; optical power loss; photoelectrothermal modeling; thermal resistance; thin-film light-emitting diode; Gallium nitride; Heating; Light emitting diodes; Optical variables measurement; Temperature; Temperature measurement; Thermal resistance; Light-emitting diodes; Light-emitting diodes (LEDs); Photo-electro-thermal theory; Thin-Film; photo-electro-thermal theory; thin-film;
fLanguage
English
Journal_Title
Industrial Electronics, IEEE Transactions on
Publisher
ieee
ISSN
0278-0046
Type
jour
DOI
10.1109/TIE.2015.2443106
Filename
7120978
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