DocumentCode :
3602993
Title :
Performance Analysis of GaN-Based Light-Emitting Diodes With Lattice-Matched InGaN/AlInN/InGaN Quantum-Well Barriers
Author :
Naiyin Wang ; Yi An Yin ; Bijun Zhao ; Ting Mei
Author_Institution :
Lab. of Nanophotonic Functional Mater. & Devices, South China Normal Univ., Guangzhou, China
Volume :
11
Issue :
12
fYear :
2015
Firstpage :
1056
Lastpage :
1060
Abstract :
In this paper, the properties of GaN-based light-emitting diodes (LEDs) with lattice-matched InGaN/AlInN/InGaN (LM-IAI) quantum-well (QW) barriers are investigated numerically. Distributions of electrostatic field, carrier current density, carrier concentration and radiative recombination rate are simulated, and internal quantum efficiency (IQE) and emission power are calculated. The results show that the LEDs with LM-IAI barriers have higher IQE and emission power over their conventional counterparts with GaN barriers due to the mitigation of the quantum-confined Stark effect and the suppression of electron leakage. Furthermore, the performances of the nitride-based LEDs with the proposed barriers can be further improved by dismissing the electron-blocking layer, which is attributed to the improvement of hole injection efficiency and the decrease of overall Auger recombination.
Keywords :
III-V semiconductors; Stark effect; aluminium compounds; carrier density; current density; electron-hole recombination; gallium compounds; indium compounds; light emitting diodes; semiconductor quantum wells; wide band gap semiconductors; Auger recombination; GaN-based light-emitting diodes; InGaN-AlInN-InGaN; carrier concentration; carrier current density; electron leakage suppression; electrostatic field distributions; hole injection efficiency; internal quantum efficiency; lattice-matched quantum-well barriers; nitride-based LEDs; quantum-confined Stark effect; radiative recombination rate; Aluminum gallium nitride; Charge carrier processes; Gallium nitride; Light emitting diodes; Radiative recombination; Wide band gap semiconductors; AlInN; light-emitting diodes (LEDs); multilayer barrier; quantum efficiency (QE);
fLanguage :
English
Journal_Title :
Display Technology, Journal of
Publisher :
ieee
ISSN :
1551-319X
Type :
jour
DOI :
10.1109/JDT.2015.2444400
Filename :
7122213
Link To Document :
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