DocumentCode
3603749
Title
Pull-In Voltage and Fabrication Yield Analysis of All-Metal-Based Nanoelectromechanical Switches
Author
You Qian ; Bo Woon Soon ; Chengkuo Lee
Author_Institution
Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
Volume
24
Issue
6
fYear
2015
Firstpage
1878
Lastpage
1886
Abstract
We designed a one-mask process for all-molybdenum-based laterally actuated nanoelectromechanical switches. The damascene-like process is designed to ensure a smooth, high-aspect ratio, and metal-to-metal mechanical contact. Based on the statistical study of 800 devices, very high process yield can be achieved for fixed-fixed beam devices by selecting suitable device dimensions, i.e., the beam length versus beam width ratio should be <;70 and the ratio of actuation gap to contact gap should be >1.5. Typical failure modes are also discussed.
Keywords
failure analysis; masks; mechanical contact; nanoactuators; nanofabrication; statistical analysis; switches; all-metal-based nanoelectromechanical switch; all-molybdenum-based laterally actuated nanoelectromechanical switch; damascene-like process; fabrication yield analysis; failure mode; fixed-fixed beam device; metal-to-metal mechanical contact; one-mask process; pull-in voltage; Contact resistance; Fabrication; Metals; Nanoelectromechanical systems; Structural beams; Surface treatment; Voltage measurement; Switches; electrostatic devices; electrostatic devices.; nanoelectromechanical systems;
fLanguage
English
Journal_Title
Microelectromechanical Systems, Journal of
Publisher
ieee
ISSN
1057-7157
Type
jour
DOI
10.1109/JMEMS.2015.2449863
Filename
7160653
Link To Document