Title :
Pull-In Voltage and Fabrication Yield Analysis of All-Metal-Based Nanoelectromechanical Switches
Author :
You Qian ; Bo Woon Soon ; Chengkuo Lee
Author_Institution :
Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
Abstract :
We designed a one-mask process for all-molybdenum-based laterally actuated nanoelectromechanical switches. The damascene-like process is designed to ensure a smooth, high-aspect ratio, and metal-to-metal mechanical contact. Based on the statistical study of 800 devices, very high process yield can be achieved for fixed-fixed beam devices by selecting suitable device dimensions, i.e., the beam length versus beam width ratio should be <;70 and the ratio of actuation gap to contact gap should be >1.5. Typical failure modes are also discussed.
Keywords :
failure analysis; masks; mechanical contact; nanoactuators; nanofabrication; statistical analysis; switches; all-metal-based nanoelectromechanical switch; all-molybdenum-based laterally actuated nanoelectromechanical switch; damascene-like process; fabrication yield analysis; failure mode; fixed-fixed beam device; metal-to-metal mechanical contact; one-mask process; pull-in voltage; Contact resistance; Fabrication; Metals; Nanoelectromechanical systems; Structural beams; Surface treatment; Voltage measurement; Switches; electrostatic devices; electrostatic devices.; nanoelectromechanical systems;
Journal_Title :
Microelectromechanical Systems, Journal of
DOI :
10.1109/JMEMS.2015.2449863