• DocumentCode
    3604153
  • Title

    Thermally Engineered Flip-Chip InGaN/GaN Well-Ordered Nanocolumn Array LEDs

  • Author

    Hayashi, Hiroaki ; Fukushima, Daishi ; Noma, Tomohiro ; Tomimatsu, Daisuke ; Konno, Yuta ; Mizuno, Makoto ; Kishino, Katsumi

  • Author_Institution
    Sophia Univ., Tokyo, Japan
  • Volume
    27
  • Issue
    22
  • fYear
    2015
  • Firstpage
    2343
  • Lastpage
    2346
  • Abstract
    Thermally engineered flip-chip (FC) InGaN/GaN well-ordered nanocolumn array light-emitting diodes (LEDs) are demonstrated for the first time. A directional photoluminescence beam profile was observed from the n-side bottom of the GaN nanocolumns, which maintained an optically damage-free periodic arrangement of nanocolumns through the FC process involving Si substrate removal by wet etching. The developed LED achieved single-peak emission at ~ 570 nm in the middle of the visible range. The thermal resistance of the nanocolumn LED was significantly reduced using the FC configuration.
  • Keywords
    III-V semiconductors; etching; flip-chip devices; gallium compounds; indium compounds; light emitting diodes; light sources; nanostructured materials; optical materials; photoluminescence; silicon; thermal resistance; thermo-optical devices; FC configuration; InGaN-GaN; Si; Si substrate removal; directional photoluminescence beam profile; optically damage-free periodic arrangement; single-peak emission; thermal resistance; thermally engineered flip-chip InGaN-GaN well-ordered nanocolumn array LED; thermally engineered flip-chip InGaN-GaN well-ordered nanocolumn array light-emitting diodes; visible spectrum; wavelength 570 nm; wet etching; Aluminum nitride; Arrays; Gallium nitride; Light emitting diodes; Silicon; Substrates; Thermal resistance; Electroluminescence; Flip-chip devices; Indium gallium nitride; Light emitting diodes; flip-chip devices; indium gallium nitride; light emitting diodes;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2015.2463756
  • Filename
    7174961