• DocumentCode
    3604275
  • Title

    A 65 nm 0.5 V DPS CMOS Image Sensor With 17 pJ/Frame.Pixel and 42 dB Dynamic Range for Ultra-Low-Power SoCs

  • Author

    Couniot, Numa ; de Streel, Guerric ; Botman, Francois ; Lusala, Angelo Kuti ; Flandre, Denis ; Bol, David

  • Author_Institution
    ICTEAM Inst., Univ. catholique de Louvain, Louvain-La-Neuve, Belgium
  • Volume
    50
  • Issue
    10
  • fYear
    2015
  • Firstpage
    2419
  • Lastpage
    2430
  • Abstract
    Adding vision capabilities to wireless sensors nodes (WSN) for the Internet-of-Things requires imagers working at ultra-low power (ULP) in nanometer CMOS systems-on-chip (SoCs). Such performance can be obtained with time-based digital pixel sensors (DPS) working at ultra-low voltage (ULV), at the expense of lower dynamic range, higher fixed-pattern noise (FPN) and thus poorer image quality. To address this problem, three key techniques were developed in this work for DPS pixels: wide-range adaptive body biasing, low-gating of the 2-transistor in-pixel comparator and digital readout performing delta-reset sampling with low switching activity and robust timing closure. These concepts were demonstrated by designing and fabricating a 128 × 128 CMOS image sensor array in a 65 nm low-power CMOS logic process. Operating at 0.5 V, it features an FPN of 0.66%, a dynamic range of 42 dB and a fill factor of 57% with a 4 μm pixel pitch, while consuming only 17 pJ/(frame.pixel) and 8.8 μW at 32 fps. These performances combined with the small silicon area of 0.69 mm2 makes the imager perfectly suitable for integration in ULP SoCs, targeting WSN applications.
  • Keywords
    CMOS image sensors; Internet of Things; comparators (circuits); digital readout; image sampling; low-power electronics; nanoelectronics; nanosensors; sensor arrays; system-on-chip; wireless sensor networks; 2-transistor in-pixel comparator; DPS CMOS image sensor array; Internet of Things; ULP SoC; WSN; delta reset sampling; digital pixel sensor; digital readout; energy 17 pJ; fixed pattern noise; nanometer CMOS systems-on-chip; power 8.8 muW; size 65 nm; time-based digital pixel sensor; ultra low power SoC; ultra low voltage; voltage 0.5 V; wide range adaptive body biasing; wireless sensors node; CMOS integrated circuits; Leakage currents; Logic gates; MOS devices; Switches; System-on-chip; Wireless sensor networks; CMOS image sensor; system-on-chip; ultra-low power; ultra-low voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2015.2457897
  • Filename
    7180418