• DocumentCode
    3604602
  • Title

    Application of a 10 V Programmable Josephson Voltage Standard in Direct Comparison With Conventional Josephson Voltage Standards

  • Author

    Yi-Hua Tang ; Wachter, James ; Rufenacht, Alain ; FitzPatrick, Gerald J. ; Benz, Samuel P.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
  • Volume
    64
  • Issue
    12
  • fYear
    2015
  • Firstpage
    3458
  • Lastpage
    3466
  • Abstract
    This paper briefly describes the working principle of the 10 V programmable Josephson voltage standard (PJVS) that was developed at the National Institute of Standards and Technology and how to use it in a direct comparison with a conventional Josephson voltage standard (CJVS). Manual and automatic comparison methods were developed to verify the agreement between the two types of Josephson standards. A 10 V PJVS provided by the National Aeronautics and Space Administration (NASA) was used as a transfer standard in the 2014 Josephson voltage standard Interlaboratory Comparison that is organized by the National Conference of Standards Laboratories International. The results of automatic direct comparisons between a NASA PJVS and three CJVSs are reported. Allan variance is applied to analyze the large number of correlated data for Type A uncertainty.
  • Keywords
    measurement standards; measurement uncertainty; transfer standards; voltage measurement; Allan variance; CJVS; NASA; National Aeronautics and Space Administration; National Conference of Standards Laboratories International; National Institute of Standards and Technology; PJVS; conventional Josephson voltage standard; programmable Josephson voltage standard; transfer standard; type A uncertainty; voltage 10 V; Josephson effect; NIST; Protocols; Uncertainty; Voltage measurement; Allan variance; Josephson arrays; Josephson voltage standards (JVSs); automated comparison; uncertainty; voltage measurement; voltage measurement.;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2015.2463392
  • Filename
    7206594