Title :
Wideband Rapid Interferer Detector Exploiting Compressed Sampling With a Quadrature Analog-to-Information Converter
Author :
Yazicigil, Rabia Tugce ; Haque, Tanbir ; Whalen, Michael R. ; Yuan, Jeffrey ; Wright, John ; Kinget, Peter R.
Author_Institution :
Electr. Eng. Dept., Columbia Univ., New York, NY, USA
Abstract :
We introduce a rapid interferer detector that uses compressed sampling (CS) with a quadrature analog-to-information converter (QAIC). By exploiting bandpass CS, a blind sub-Nyquist sampling approach, the QAIC offers an energy efficient and rapid interferer detection over a wide instantaneous bandwidth. The QAIC front end is implemented in 65 nm CMOS in 0.43 mm 2 and consumes 81 mW from a 1.1 V supply. It senses a frequency span of 1 GHz ranging from 2.7 to 3.7 GHz (PCAST Band) with a resolution bandwidth of 20 MHz in 4.4 μs, 50 times faster than traditional sweeping spectrum scanners. Rapid interferer detector with the bandpass QAIC is two orders of magnitude more energy efficient than traditional Nyquist-rate architectures and one order of magnitude more energy efficient than existing low-pass CS methods. Thanks to CS, the aggregate sampling rate of the QAIC interferer detector is compressed by 6.3 × compared to traditional Nyquist-rate architectures for the same instantaneous bandwidth.
Keywords :
CMOS integrated circuits; UHF integrated circuits; analogue-digital conversion; data compression; field effect MMIC; interference suppression; radio equipment; radiofrequency interference; signal sampling; CMOS integrated circuit; PCAST band; bandwidth 1 GHz; blind subNyquist sampling; compressed sampling; frequency 2.7 GHz to 3.7 GHz; power 81 mW; quadrature analog-to-information converter; size 65 nm; voltage 1.1 V; wideband rapid interferer detector; Aggregates; Detectors; Distance measurement; Energy consumption; Noise; Wideband; Cognitive radio; compressed sampling; interferer detection; multi-tiered shared spectrum access; quadrature analog-to-information converter; spectrum sensor;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2015.2464708