• DocumentCode
    3605481
  • Title

    Strengthening SIMON Implementation Against Intelligent Fault Attacks

  • Author

    Dofe, Jaya ; Frey, Jonathan ; Pahlevanzadeh, Hoda ; Qiaoyan Yu

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of New Hampshire, Durham, NH, USA
  • Volume
    7
  • Issue
    4
  • fYear
    2015
  • Firstpage
    113
  • Lastpage
    116
  • Abstract
    Driven by malicious intent, attackers are impelled to extract the cipher key and thus compromise the cryptosystem through fault attacks. Existing fault-detection methods can effectively detect random faults in the cipher implementation, but yield a high fault bypass rate (FBR) under intelligent fault attacks. To address this limitation, we propose a new microarchitecture to thwart fault attacks that place mathematically symmetric faults on the two encryption data paths. To further reduce the FBR for a new lightweight cipher SIMON, we propose a new countermeasure that integrates operand permutation and masking techniques. Closed-form expressions for depermutation and demasking in SIMON are provided in this letter. Our method was assessed under two fault attack scenarios (random and symmetric fault injections) with bit-flip, stuck-at-0, and stuck-at-1 fault models. Simulation results show that our method minimizes the FBR to zero with the fault attack scenarios of symmetric fault location and stuck-at-0 fault injections. Overall, the proposed method outperforms the existing fault-detection methods in multiple fault attack conditions, at the cost of 5% more area overhead than the most hardware-efficient fault detection method.
  • Keywords
    cryptography; fault diagnosis; SIMON implementation; bit-flip fault models; cipher key; cryptosystem; encryption data paths; fault bypass rate; fault-detection methods; intelligent fault attacks; masking techniques; mathematically symmetric faults; operand permutation; random fault injections; stuck-at-0 fault models; stuck-at-1 fault models; symmetric fault injections; Ciphers; Circuit faults; Computer security; Encryption; Fault detection; Microarchitecture; Block cipher; cryptography; fault attacks; fault bypass rate; fault detection; security; simon;
  • fLanguage
    English
  • Journal_Title
    Embedded Systems Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1943-0663
  • Type

    jour

  • DOI
    10.1109/LES.2015.2477273
  • Filename
    7244186