DocumentCode :
3605602
Title :
Ge/ZnS-Based Micromachined Fabry–Perot Filters for Optical MEMS in the Longwave Infrared
Author :
Haifeng Mao ; Dilusha Silva, K.K.M.B. ; Martyniuk, Mariusz ; Antoszewski, Jarek ; Bumgarner, John ; Dell, John M. ; Faraone, Lorenzo
Author_Institution :
Sch. of Electr., Electron. & Comput. Eng., Univ. of Western Australia, Crawley, WA, Australia
Volume :
24
Issue :
6
fYear :
2015
Firstpage :
2109
Lastpage :
2116
Abstract :
This paper reports on the successful demonstration of Ge/ZnS-based Fabry-Perot filters operating in the longwave infrared (LWIR). The suitability of thermally deposited Ge and ZnS as thin-film mirror materials for micromachined LWIR Fabry-Perot filters has been fully investigated, and it is shown that a film growth temperature higher than 150 °C is key to depositing durable ZnS films. The optical constants of Ge and ZnS films in the LWIR band reveal that the material pair possesses high refractive index contrast and excellent LWIR transparency. Fixed-cavity LWIR Fabry-Perot filters with a 150-μm circular single-layer Ge top mirror and a four-layer Ge/ZnS/Ge/ZnS bottom mirror were fabricated. Curvature in the suspended top mirror was corrected using a thin SiNx stress-compensation layer. After curvature correction, a mirror flatness of 550 nm was achieved, and the filter demonstrated a 60% peak transmission with a full-width at half-maximum of 700 nm as well as a out-of-band rejection of 24:1.
Keywords :
II-VI semiconductors; germanium; metallic thin films; micromechanical devices; mirrors; optical filters; semiconductor thin films; silicon compounds; wide band gap semiconductors; zinc compounds; Ge films; Ge-ZnS-Ge-ZnS; Ge/ZnS-based micromachined Fabry-Perot filters; SiNx; ZnS films; circular single-layer Ge top mirror; fixed-cavity LWIR Fabry-Perot filters; four-layer bottom mirror; longwave infrared band; micromachined LWIR Fabry-Perot filters; optical MEMS; refractive index contrast; size 150 mum; stress-compensation layer; thermally deposited Ge; thermally deposited ZnS; thin-film mirror materials; II-VI semiconductor materials; Mirrors; Optical device fabrication; Optical filters; Optical refraction; Optical variables control; Zinc compounds; Fabry-Perot; LWIR; longwave infrared; micromachining; multispectral; optical filter; thermal imaging; thermal imaging.;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2015.2474858
Filename :
7254120
Link To Document :
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