• DocumentCode
    3605761
  • Title

    Elimination of Spurious Modes in SH0 Lithium Niobate Laterally Vibrating Resonators

  • Author

    Yong-Ha Song ; Songbin Gong

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • Volume
    36
  • Issue
    11
  • fYear
    2015
  • Firstpage
    1198
  • Lastpage
    1201
  • Abstract
    This letter reports on a spurious mode suppression technique for the shear horizontal (SH0) mode lithium niobate laterally vibrating resonators. The concept utilizes triangular and arched edge shapes on the transversal sides of a resonant cavity to effectively distribute and scatter the acoustic waves in the inactive regions, yielding the suppression of transverse spurious modes. 2D models and 3D finite-element analyses were employed to theoretically verify the technique. For devices with the archedshape edges, complete removal of higher order transverse modes has been experimentally demonstrated with 2× enhancement for quality factor (Q). The Q enhancement arises from the improved concentration of mechanical energy under the inter-digitated transducers. The fabricated device exhibits a Q of 920, a large electromechanical coupling (kt2 ) of 17.8%, and a figure of merit of 164.
  • Keywords
    Q-factor; acoustic wave scattering; cavity resonators; finite element analysis; lithium; niobium compounds; 3D finite-element analysis; SH0 lithium niobate; acoustic wave scattering; electromechanical coupling; interdigitated transducer; laterally vibrating resonator; quality factor; resonant cavity; shear horizontal mode lithium niobate; spurious mode elimination; spurious mode suppression technique; transverse spurious mode; Acoustic waves; Aluminum nitride; Electrodes; III-V semiconductor materials; Lithium niobate; Optical resonators; Lithium niobate; high electromechanical coupling; laterally vibrating resonators; piezoelectric resonators; spurious mode suppression;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2015.2478378
  • Filename
    7265019