DocumentCode :
3605897
Title :
Application of Electrically Invisible Antennas to the Modulated Scatterer Technique
Author :
Crocker, Dylan A. ; Donnell, Kristen M.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
Volume :
64
Issue :
12
fYear :
2015
Firstpage :
3526
Lastpage :
3535
Abstract :
The modulated scatterer technique (MST) has shown promise for applications in microwave imaging, electric field mapping, and materials characterization. Traditionally, MST scatterers are dipoles centrally loaded with an element capable of modulation (e.g., a p-i-n diode). By modulating the load element, signals scattered from the MST scatterer are also modulated. However, due to the small size of such scatterers, it can be difficult to reliably detect the modulated signal. Increasing the modulation depth (MD; a parameter related to how well the scatterer modulates the scattered signal) may improve the detectability of the scattered signal. In an effort to improve the MD, the concept of electrically invisible antennas is applied to the design of MST scatterers. This paper presents simulations and measurements of MST scatterers that have been designed to be electrically invisible during the reverse bias state of the modulated element (a p-i-n diode in this case), while producing detectable scattering during the forward bias state (i.e., operate in an electrically visible state). The results using the new design show significant improvement to the MD of the scattered signal as compared with a traditional MST scatterer (i.e., dipole centrally loaded with a p-i-n diode).
Keywords :
dipole antennas; electromagnetic wave scattering; microwave antennas; modulation; p-i-n diodes; MST scatterers; detectable scattering; electric field mapping; electrically invisible antennas; forward bias state; materials characterization; microwave imaging; modulated element; modulated scatterer technique; modulated signal; modulation depth; p-i-n diode; reverse bias state; Dipole antennas; Impedance; Inductors; Microwave imaging; Modulation; P-i-n diodes; Scattering; Dual-loaded scatterer (DLS); invisible antennas; microwave imaging; modulated scatterer technique (MST); modulation depth (MD); modulation depth (MD).;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2015.2454671
Filename :
7270282
Link To Document :
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