DocumentCode :
3606749
Title :
Effects of {\\hbox {Na}}^ + , {\\hbox {Mg}}^{2+} ,
Author :
Awater, Roy H. P. ; Kramer, Karl W. ; Dorenbos, Pieter
Author_Institution :
Dept. of Radiat. Sci. & Technol., Delft Univ. of Technol., Delft, Netherlands
Volume :
62
Issue :
5
fYear :
2015
Firstpage :
2343
Lastpage :
2348
Abstract :
The effects of Na+, Mg2 +, Ca2 +, Sr2 + and Ba2 + doping on the scintillation properties of CeBr3 are evaluated in this paper. Ca2 + and Sr2 + doped CeBr3 show different scintillation properties as compared to undoped CeBr3, i.e. an additional perturbed Ce3 + site with emission maxima red-shifted by 30 nm compared to unperturbed Ce3 + sites as evidenced by X-ray excited emission and photoluminescence measurements. Also a nearly constant light yield at temperatures below 300 K, an increased decay time and the appearance of multiple glow peaks in thermoluminescence measurements are observed for Ca and Sr doped CeBr3. These effects on the scintillation properties of CeBr3 are explained using a single trap model where Br vacancies, formed as charge compensation for the aliovalent dopants, act as electron traps.
Keywords :
barium; calcium; cerium compounds; doping; magnesium; photoluminescence; scintillation; sodium; solid scintillation detectors; strontium; Ba2+ doping effect; Br vacancy; Ca2+ doped CeBr3; Ca2+ doping effect; Mg2+ doping effect; Na+ doping effect; Sr2+ doped CeBr3; Sr2+ doping effect; X-ray excited emission; aliovalent dopant charge compensation; constant light yield; decay time; electron trap; photoluminescence measurement; red-shifted emission maxima; single trap model; thermoluminescence measurement multiple glow peak; undoped CeBr3 scintillation property; unperturbed Ce3+ site; Barium; Crystals; Doping; Electron traps; Energy resolution; Temperature measurement; Thermoluminescence; ${hbox {CeBr}}_3$; Aliovalent doping; decay time constant; emission; photoelectron yield; scintillator detectors;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2015.2463736
Filename :
7274371
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