DocumentCode
3606808
Title
Scintillation Detector Timing Resolution; A Study by Ray Tracing Software
Author
ter Weele, David N. ; Schaart, Dennis R. ; Dorenbos, Pieter
Author_Institution
Delft Univ. of Technol., Delft, Netherlands
Volume
62
Issue
5
fYear
2015
Firstpage
1972
Lastpage
1980
Abstract
Time-of-flight positron emission tomography requires high timing resolution. In this paper, we determined the influence of scintillation properties on the detector timing resolution for crystals with non-negligible optical transit timespread. In addition to intrinsic scintillation properties, such as the light yield, decay time constant, and scintillation rise time, we also studied the relation between the timing resolution and extrinsic scintillation properties, such as the dimensions of the crystal, the absorption probability of the reflector, the dwell time of photons inside the reflector during the reflection process, and the crystal polish. For this purpose, we developed ray-tracing software. The crystals simulated in this paper are LSO:Ce, LYSO:Ce, LSO:Ce,0.2%Ca, LYSO:0.11%Ce,0.2%Mg, and LYSO:0.2%Ce,0.2%Ca, with dimensions 3 ×3 ×5 mm3, 3 ×3 ×10 mm3, 3 ×3 ×20 mm3, and 4 ×4 ×22 mm3. We furthermore studied the optical transit timespread of photons inside polished and etched crystals, which explains the differences in timing resolution.
Keywords
absorption; positron emission tomography; ray tracing; reflection; solid scintillation detectors; crystal dimensions; decay time constant; etched crystal; extrinsic scintillation properties; high timing resolution; intrinsic scintillation properties; light yield; nonnegligible optical transit timespread; optical transit timespread; polished crystal; ray tracing software; reflection process; reflector absorption probability; scintillation detector timing resolution; scintillation properties; scintillation rise time; time-of-flight positron emission tomography; Crystals; Detectors; Optical detectors; Photonics; Ray tracing; Software; Timing; Absorption probability; crystal polish; decay time constant; dwell time; light yield; optical transit time-spread; ray-tracing software; scintillation rise time; simulation; timing resolution;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2015.2460266
Filename
7274486
Link To Document