DocumentCode :
3606818
Title :
Modeling of Radiation Effects in Silicon Photonic Devices
Author :
De Leonardis, Francesco ; Troia, Benedetto ; Campanella, Carlo Edoardo ; Prudenzano, Francesco ; Passaro, Vittorio M. N.
Author_Institution :
Dept. of Electr. & Inf. Eng., Politec. di Bari, Bari, Italy
Volume :
62
Issue :
5
fYear :
2015
Firstpage :
2155
Lastpage :
2168
Abstract :
The influence of high energy radiations on the performance of silicon-on-insulator photonic devices, such as straight waveguides, ring resonators and Raman lasers based on resonant microcavities, has been investigated theoretically in the near infrared. The modeling is based on a generalized full-vectorial wave equation system which also includes deep defect rate equations. Simulation results are compared with the state-of-the-art, demonstrating a very good agreement between theoretical predictions and experiments reported in literature in the case of both ionizing and nonionizing events. Moreover, a parametric analysis is presented in order to investigate the degradation mechanisms of photonic device performance that occur under the influence of radiation bombardment.
Keywords :
Raman lasers; radiation effects; Raman lasers; defect rate equations; degradation mechanisms; full-vectorial wave equation system; high energy radiation effect modeling; nonionizing events; parametric analysis; photonic device performance; radiation bombardment; resonant microcavities; ring resonators; silicon-on-insulator photonic devices; straight waveguides; Mathematical model; Nonlinear optics; Optical pumping; Optical waveguides; Silicon photonics; Modeling and theory; nonlinear optical effects; radiation effects; silicon photonics; stress effect; thermal effect; waveguide devices;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2015.2469671
Filename :
7274496
Link To Document :
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