Title :
A 4.5 mW CT Self-Coupled
Modulator With 2.2 MHz BW and 90.4 dB SNDR Using Residual ELD Compensation
Author :
Chen-Yen Ho ; Cong Liu ; Chi-Lun Lo ; Hung-Chieh Tsai ; Tze-Chien Wang ; Yu-Hsin Lin
Author_Institution :
MediaTek Inc., Hsinchu, Taiwan
Abstract :
This paper presents a power-efficient single-loop continuous-time (CT) ΔΣ modulator (DSM) that achieves a SNDR of 90.4 dB over a 2.2 MHz signal bandwidth. The modulator uses a fourth-order feed-forward architecture incorporating the continuous-time self-coupling (CTSC) technique. Moreover, to reduce hardware area, this design utilizes the residual signal for excess loop delay (ELD) compensation. To improve linearity, low-ripple DAC latches and low toggle-rate dynamic element matching (DEM) algorithm are adopted. This DSM is fabricated in a 55 nm LP CMOS technology. Operating at 140 MHz sampling rate, the chip consumes 4.5 mW from power supplies of 1.2 V and 1.8 V. It achieves 90.4 dB SNDR and 92 dB dynamic range (DR) with a 2.2 MHz signal bandwidth, resulting in a Schreier FOM of 177.3 dB and 178.9 dB based on SNDR and DR, respectively. The chip area is 0.09 mm 2.
Keywords :
CMOS logic circuits; compensation; coupled circuits; delta-sigma modulation; flip-flops; radiofrequency integrated circuits; CT self-coupled ΔΣ modulator; CTSC technique; DEM algorithm; DSM; LP CMOS technology; bandwidth 2.2 MHz; continuous-time self-coupling technique; excess loop delay; fourth-order feedforward architecture; frequency 140 MHz; gain 178.9 dB; gain 92 dB; low-ripple DAC latch; noise figure 177.3 dB; noise figure 90.4 dB; power 4.5 mW; power-efficient single-loop continuous-time delta-sigma modulator; residual ELD compensation; size 55 nm; toggle-rate dynamic element matching algorithm; voltage 1.2 V; voltage 1.8 V; Clocks; Delays; Latches; Modulation; Noise; Quantization (signal); Resistors; Analog-to-digital converter (ADC); continuous-time delta-sigma modulator (CT DSM); continuous-time self-coupling (CTSC); excess loop delay (ELD) compensation;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2015.2475160