A Wide-Band, 5-Tap Transversal Filter With Improved Testability for Equalization up to 84 Gb/s

Author

Yu Ban ; De Keulenaer, Timothy ; Zhisheng Li ; Van Kerrebrouck, Joris ; Sinsky, Jeffrey H. ; Kozicki, Bartek ; Bauwelinck, Johan ; Torfs, Guy

Author_Institution

Dept. of Inf. Technol., Ghent Univ., Ghent, Belgium

Volume

25

Issue

11

fYear

2015

Firstpage

739

Lastpage

741

Abstract

A millimeter wave integrated transversal filter operating at up to 84 Gb/s is presented. The implemented topology offers improved testability, which allows for filter characterization in both the time and frequency domain. The filter has an input and output return loss better than 10 dB up to 67 GHz. Using this filter, frequency equalization of an NRZ input to either an NRZ or a duobinary output is demonstrated at 84 Gb/s across a channel consisting of a 5 cm differential grounded coplanar waveguide trace and a pair of 80 cm coaxial cables. The filter is implemented in 130 nm SiGe BiCMOS process, has a die area of 2.5 mm × 1.4 mm and consumes 210 mW from a 2.5 V power supply.

Keywords

BiCMOS integrated circuits; Ge-Si alloys; coaxial cables; coplanar waveguides; millimetre wave filters; transversal filters; BiCMOS process; NRZ input; SiGe; coaxial cables; differential grounded coplanar waveguide trace; duobinary output; filter characterization; frequency domain; frequency equalization; millimeter wave integrated transversal filter; power 210 mW; return loss; size 1.4 mm; size 130 nm; size 2.5 mm; size 5 cm; size 80 cm; time domain; voltage 2.5 V; wide-band transversal filter; BiCMOS integrated circuits; Design for testability; Time-domain analysis; Time-frequency analysis; Transversal filters; Design for testability; duobinary; equalization coefficients; impulse response; transversal filter;

fLanguage

English

Journal_Title

Microwave and Wireless Components Letters, IEEE

Publisher

ieee

ISSN

1531-1309

Type

jour

DOI

10.1109/LMWC.2015.2479844

Filename

7287794