DocumentCode :
3608188
Title :
Radiated spurious emission measurements using fast Fourier transform-based time domain scan
Author :
Zhi Wei Sim ; Jian Song
Author_Institution :
Rohde & Schwarz Asia Pte Ltd., Singapore, Singapore
Volume :
9
Issue :
7
fYear :
2015
Firstpage :
882
Lastpage :
889
Abstract :
In this study, the use of time domain (TD) scan based on fast Fourier transform technique for radiated spurious emission (RSE) measurements is investigated. Measurement time and results of TD scan are compared with those of conventional frequency sweep method. The RSE measurements carried out are based on two different wireless technologies, that is, GSM 900 and GSM 1800. The findings show that the TD scan can reduce overall RSE test time up to 86% with comparable measurement results.
Keywords :
fast Fourier transforms; radiation detection; time-domain analysis; GSM 1800; GSM 900; RSE measurement; TD scan; fast Fourier transform; frequency sweep method; radiated spurious emission measurement; time domain scan; time measurement; wireless technology;
fLanguage :
English
Journal_Title :
Science, Measurement Technology, IET
Publisher :
iet
ISSN :
1751-8822
Type :
jour
DOI :
10.1049/iet-smt.2014.0333
Filename :
7296735
Link To Document :
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