DocumentCode :
3608242
Title :
Design and Analysis of Low-Power High-Frequency Robust Sub-Harmonic Injection-Locked Clock Multipliers
Author :
Elkholy, Ahmed ; Talegaonkar, Mrunmay ; Anand, Tejasvi ; Kumar Hanumolu, Pavan
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Volume :
50
Issue :
12
fYear :
2015
Firstpage :
3160
Lastpage :
3174
Abstract :
A low-jitter, low-power LC-based injection-locked clock multiplier (ILCM) with a digital frequency-tracking loop (FTL) is presented. Based on a pulse gating technique, the proposed FTL continuously tunes the oscillator´s free-running frequency to ensure robust operation across PVT variations. The FTL resolves the race condition existing in injection-locked PLLs by decoupling frequency tuning from the injection path, such that the phase-locking condition is only determined by the injection path. This paper also introduces an accurate theoretical large-signal analysis for phase domain response (PDR) of injection-locked oscillators (ILOs). The proposed PDR analysis captures the asymmetric nature of ILO´s lock-in range, and the impact of frequency error on injection strength and phase noise performance. The proposed architecture and analysis are demonstrated by a prototype fabricated in 65 nm CMOS process with active area of 0.25 mm2. The prototype ILCM generates output clock in the range of 6.75-8.25 GHz by multiplying the reference clock by 64. It achieves superior integrated jitter performance of 190 fsrms, while consuming 2.25 mW power. This translates to an excellent figure-of-merit (FoM) of -251 dB, which is the best reported high-frequency clock multiplier.
Keywords :
CMOS digital integrated circuits; clocks; injection locked oscillators; multiplying circuits; phase noise; CMOS process; FTL; FoM; ILCM; ILO; PDR analysis; decoupling frequency tuning; digital frequency-tracking loop; figure-of-merit; free-running frequency; frequency 6.75 GHz to 8.25 GHz; frequency error; injection path; injection strength; injection-locked PLL; injection-locked oscillators; integrated jitter performance; large-signal analysis; lock-in range; low-jitter low-power LC-based injection-locked clock multiplier; phase domain response; phase noise performance; phase-locking condition; power 2.25 mW; pulse gating technique; reference clock; size 65 nm; Capacitors; Clocks; Jitter; Noise; Oscillators; Phase locked loops; Timing; Clock multiplier; DCO; PLLs; digital phase-locked loop (PLL); frequency multiplier; frequency tracking; impulse sensitivity function (ISF); injection locking; multiplying injection-locked oscillator (MILO); phase domain response (PDR); phase noise; pulse; reference spur; rms jitter; sub-harmonic locking; sub-sampling (SS);
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2015.2478449
Filename :
7297803
Link To Document :
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