DocumentCode :
3608462
Title :
Experimental Verification of the Recursive T-Matrix Method Solutions at Microwave Frequencies
Author :
Xueyang Duan ; Haynes, Mark ; Moghaddam, Mahta
Author_Institution :
Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA, USA
Volume :
63
Issue :
12
fYear :
2015
Firstpage :
5727
Lastpage :
5740
Abstract :
We present an experimental verification of the recursive T-matrix method (RTM), which is a common method for solving electromagnetic scattering from multiple scatterers. This is done using an antenna and propagation model uniquely suited for T-matrices and network analyzer measurements. In the experiments, we use a multistatic system to measure the scattering from collections of objects consisting of conducting or dielectric spheres, as well as conducting cylinders. In simulation, we calculate the scattering from the objects using the RTM and further predict the transition parameters expected between the receivers and the transmitter in the measurement setup using a propagation model. The predicted and measured values of the transmission parameters are compared, and thereby used to verify the recursive T-matrix algorithm. Good agreement observed in these results provides experimental validation of the RTM.
Keywords :
electromagnetic wave scattering; matrix algebra; network analysers; recursive estimation; RTM; antenna model; conducting cylinders; conducting spheres; dielectric spheres; electromagnetic scattering; microwave frequencies; multiple scatterers; multistatic system; network analyzer measurements; propagation model; receivers; recursive T-matrix method solutions; transition parameters; transmitter; Antenna measurements; Antennas; Computational modeling; Frequency measurement; Receivers; Scattering; Transmitters; Multiple scatterers; multiple scatterers; random media scattering; recursive T-matrix method; recursive T-matrix method (RTM); scattering measurements;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/TAP.2015.2491967
Filename :
7299640
Link To Document :
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