Title :
Real-Time Operation and Characterization of a High-Performance Time-Based Accelerometer
Author :
Alves Dias, Rosana ; Serra Alves, Filipe ; Costa, Margaret ; Fonseca, Helder ; Cabral, Jorge ; Gaspar, Joao ; Rocha, Luis Alexandre
Author_Institution :
Int. Iberian Nanotechnol. Lab., Braga, Portugal
Abstract :
An accelerometer based on the electrostatic pull-in time of a microstructure is presented in this paper. The device uses a parallel-plate overdamped microstructure, and real-time control operation is performed using a field programmable gate array and high precision digital-to-analog converters. Both open-loop and closed-loop measurements are presented. The low noise is a key feature of this approach, which is limited only by the mechanical-thermal noise of the microstructure used, 2 μg/√Hz as shown in the open-loop results (3 μg/√Hz in closed-loop operation). The time readout method has extremely high-resolution capabilities. The pull-in time sensitivity can be adjusted up to 1.6 μs/μg, and the electrostatic feedback voltage sensitivity is 61.3 V2/g. The closed-loop control allows operation of the accelerometer in a much larger range than in open-loop (±500 mg have been achieved) and the linearity is greatly improved (<;1%FS). The current closed-loop control algorithm allows operation up to 2 Hz. A bias stability of 50 μg has been measured over 45 h in open loop and 250 μg in closed loop.
Keywords :
accelerometers; digital-analogue conversion; field programmable gate arrays; thermal noise; closed-loop measurements; electrostatic feedback voltage sensitivity; electrostatic pull-in time; field programmable gate array; high precision digital-to-analog converters; high-performance time-based accelerometer; mechanical-thermal noise; open-loop measurements; parallel-plate overdamped microstructure; real-time characterization; real-time control operation; Acceleration; Accelerometers; Microstructure; Noise; Sensitivity; Temperature measurement; Temperature sensors; Pull-in time accelerometer; electrostatic feedback control; electrostatic feedback control.;
Journal_Title :
Microelectromechanical Systems, Journal of
DOI :
10.1109/JMEMS.2015.2487686