CMOS 65 nm ´on chip´ broadband real time substrate noise measurement

A CMOS 65 nm substrate crosstalk noise sensor with exceptional performance characteristics was implemented. The sensor is integrated and fabricated onto the same die with a pin-grid array packaged ZigBee transceiver. It provides a gain of 6.5 dB in an operating bandwidth from 1 MHz to 4.5 GHz and a -1 dB gain compression point for an input signal amplitude of 124 mV. Its superior substrate noise sensing capacity is demonstrated using measurements in an advanced wireless communication system on chip, having a programmable CMOS control logic of 120 kGate acting as the substrate noise transmitter.