Title : 
Analysis and Equivalent-Circuit Model for CMOS On-Chip Multiple Coupled Inductors in the Millimeter-Wave Region
         
        
            Author : 
Zongzhi Gao ; Kai Kang ; Zhengdong Jiang ; Yunqiu Wu ; Chenxi Zhao ; Yong-Lin Ban ; Lingling Sun ; Quan Xue ; Wen-Yan Yin
         
        
            Author_Institution : 
Sch. of Electron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
         
        
        
        
        
        
        
            Abstract : 
A growing number of on-chip inductors have been applied in the millimeter-wave IC design. The coupling effects between them have a negative impact on the performance of the circuit and each on-chip inductor. In this paper, a new equivalent-circuit model and a parameter extraction method for multiple on-chip inductors in the millimeter-wave region are proposed. The impacts of coupling effects on every onchip inductor are comprehensive considered in the proposed parameter extraction method. The characteristics of the multiple on-chip-coupled inductors are analyzed, modeled, and measured. The test structures were fabricated by 0.18-μm and 90-nm CMOS processes. The inductances, quality factors, and S-parameters of the model agree well with the measured performance of on-chip-nested and side-by-side-coupled inductors over a wide frequency range from 10 MHz up to millimeter-wave frequency band.
         
        
            Keywords : 
CMOS integrated circuits; Q-factor; S-parameters; equivalent circuits; inductors; millimetre wave integrated circuits; CMOS on-chip multiple coupled inductors; S-parameters; equivalent-circuit model; millimeter-wave IC design; millimeter-wave region; multiple on-chip inductors; parameter extraction method; quality factors; size 0.18 mum; size 90 nm; CMOs technology; Capacitance; Equivalent circuits; Inductors; Millimeter wave technology; Semiconductor device modeling; System-on-chip; CMOS; equivalent-circuit model; millimeter wave; multiple coupled inductors; nested coupled inductors; nested coupled inductors.;
         
        
        
            Journal_Title : 
Electron Devices, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TED.2015.2488840