• DocumentCode
    3609496
  • Title

    Analysis and Equivalent-Circuit Model for CMOS On-Chip Multiple Coupled Inductors in the Millimeter-Wave Region

  • Author

    Zongzhi Gao ; Kai Kang ; Zhengdong Jiang ; Yunqiu Wu ; Chenxi Zhao ; Yong-Lin Ban ; Lingling Sun ; Quan Xue ; Wen-Yan Yin

  • Author_Institution
    Sch. of Electron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • Volume
    62
  • Issue
    12
  • fYear
    2015
  • Firstpage
    3957
  • Lastpage
    3964
  • Abstract
    A growing number of on-chip inductors have been applied in the millimeter-wave IC design. The coupling effects between them have a negative impact on the performance of the circuit and each on-chip inductor. In this paper, a new equivalent-circuit model and a parameter extraction method for multiple on-chip inductors in the millimeter-wave region are proposed. The impacts of coupling effects on every onchip inductor are comprehensive considered in the proposed parameter extraction method. The characteristics of the multiple on-chip-coupled inductors are analyzed, modeled, and measured. The test structures were fabricated by 0.18-μm and 90-nm CMOS processes. The inductances, quality factors, and S-parameters of the model agree well with the measured performance of on-chip-nested and side-by-side-coupled inductors over a wide frequency range from 10 MHz up to millimeter-wave frequency band.
  • Keywords
    CMOS integrated circuits; Q-factor; S-parameters; equivalent circuits; inductors; millimetre wave integrated circuits; CMOS on-chip multiple coupled inductors; S-parameters; equivalent-circuit model; millimeter-wave IC design; millimeter-wave region; multiple on-chip inductors; parameter extraction method; quality factors; size 0.18 mum; size 90 nm; CMOs technology; Capacitance; Equivalent circuits; Inductors; Millimeter wave technology; Semiconductor device modeling; System-on-chip; CMOS; equivalent-circuit model; millimeter wave; multiple coupled inductors; nested coupled inductors; nested coupled inductors.;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2015.2488840
  • Filename
    7312452