• DocumentCode
    3609503
  • Title

    Theory of Superjunction With NFD and FD Modes Based on Normalized Breakdown Voltage

  • Author

    Wentong Zhang ; Bo Zhang ; Zehong Li ; Ming Qiao ; Zhaoji Li

  • Author_Institution
    State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • Volume
    62
  • Issue
    12
  • fYear
    2015
  • Firstpage
    4114
  • Lastpage
    4120
  • Abstract
    A new relationship between the specific ON-resistance RON and breakdown voltage VB for the balanced symmetric superjunction (SJ) device is presented to produce the lowest RON for a given VB. The design formulas, including the doping density NW and the drift length Ld, are given for both the nonfull depletion (NFD) and the full depletion SJ devices with an introduction of the normalized VB factor η. For the NFD SJ MOSFET, an RON ∝ V1.03 B relationship is obtained. The analytical results show good agreement with the numerical results.
  • Keywords
    MOSFET; doping; semiconductor device breakdown; NFD SJ MOSFET; NFD modes; balanced symmetric superjunction device; doping density; full depletion SJ devices; nonfull depletion modes; normalized breakdown voltage; superjunction theory; Breakdown voltage; Doping; Electric breakdown; Electric potential; MOSFET; PIN photodiodes; Resistance; Full depletion (FD) mode; nonfull depletion (NFD) mode; normalized breakdown voltage; specific ON-resistance; superjunction (SJ); superjunction (SJ).;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2015.2491360
  • Filename
    7312473