• DocumentCode
    3609515
  • Title

    SEL Hardness Assurance in a Mixed Radiation Field

  • Author

    Garcia Alia, Ruben ; Brugger, Markus ; Danzeca, Salvatore ; Ferlet-Cavrois, Veronique ; Frost, Christopher ; Gaillard, Remi ; Mekki, Julien ; Saigne, Frederic ; Thornton, Adam ; Uznanski, Slawosz ; Wrobel, Frederic

  • Author_Institution
    CERN, Genève, Switzerland
  • Volume
    62
  • Issue
    6
  • fYear
    2015
  • Firstpage
    2555
  • Lastpage
    2562
  • Abstract
    This paper explores the relationship between monoenergetic and mixed-field Single Event Latchup (SEL) cross sections, concluding that for components with a very strong energy dependence and highly-energetic environments, test results from monoenergetic or soft mixed-field spectra can significantly underestimate the operational failure rate. We introduce a semi-empirical approach that can be used to evaluate the SEL rate for such environments based on monoenergetic measurements and information or assumptions on the respective sensitive volume and materials surrounding it. We show that the presence of high-Z materials such as tungsten is particularly important in determining the hadron cross section energy dependence for components with relatively large LET thresholds.
  • Keywords
    flip-flops; integrated circuit measurement; integrated circuit reliability; logic testing; radiation hardening (electronics); SEL hardness assurance; hadron cross section; mixed radiation field; monoenergetic measurements; single event latchup; soft mixed field spectra; Large Hadron Collider; Monte Carlo methods; Single event latchups; Single event upsets; Tungsten; CERN; CHARM radiation facility; FLUKA; Monte Carlo methods; hardness assurance; high-Z materials; large hadron collider (LHC); single event latchup (SEL);
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2015.2477597
  • Filename
    7312510