DocumentCode
3609515
Title
SEL Hardness Assurance in a Mixed Radiation Field
Author
Garcia Alia, Ruben ; Brugger, Markus ; Danzeca, Salvatore ; Ferlet-Cavrois, Veronique ; Frost, Christopher ; Gaillard, Remi ; Mekki, Julien ; Saigne, Frederic ; Thornton, Adam ; Uznanski, Slawosz ; Wrobel, Frederic
Author_Institution
CERN, Genève, Switzerland
Volume
62
Issue
6
fYear
2015
Firstpage
2555
Lastpage
2562
Abstract
This paper explores the relationship between monoenergetic and mixed-field Single Event Latchup (SEL) cross sections, concluding that for components with a very strong energy dependence and highly-energetic environments, test results from monoenergetic or soft mixed-field spectra can significantly underestimate the operational failure rate. We introduce a semi-empirical approach that can be used to evaluate the SEL rate for such environments based on monoenergetic measurements and information or assumptions on the respective sensitive volume and materials surrounding it. We show that the presence of high-Z materials such as tungsten is particularly important in determining the hadron cross section energy dependence for components with relatively large LET thresholds.
Keywords
flip-flops; integrated circuit measurement; integrated circuit reliability; logic testing; radiation hardening (electronics); SEL hardness assurance; hadron cross section; mixed radiation field; monoenergetic measurements; single event latchup; soft mixed field spectra; Large Hadron Collider; Monte Carlo methods; Single event latchups; Single event upsets; Tungsten; CERN; CHARM radiation facility; FLUKA; Monte Carlo methods; hardness assurance; high-Z materials; large hadron collider (LHC); single event latchup (SEL);
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2015.2477597
Filename
7312510
Link To Document