DocumentCode
3610396
Title
Control scheme of the de-icing method by the transferred current of bundled conductors and its key parameters
Author
Xingliang Jiang ; Yaoxuan Wang ; Lichun Shu ; Zhijin Zhang ; Qin Hu ; Quanlin Wang
Author_Institution
State Key Lab. of Power Transm. Equip. & Syst. Security & New Technol., Chongqing Univ., Chongqing, China
Volume
9
Issue
15
fYear
2015
Firstpage
2198
Lastpage
2205
Abstract
Transferring the current of bundled sub-conductors through smart switching modules is a promising de-icing method. This study explores the application of line impedance modulation to line de-icing. The control requirements of the de-icing method by transferred current are illustrated according to the characteristics of the method, and two key parameters, namely, critical ice-melting current and ice-melting time, are introduced. The analytical expression for the critical ice-melting current is deduced theoretically. On this basis, the effect of icing shape on the critical ice-melting current is analysed and discussed, along with the calculation of the critical ice-melting current when icing on the windward surface of conductor. A simplified method for calculating ice-melting time is presented on the basis of the heat balance equation during the ice-melting process. With the control requirements of this method as a framework, the calculation and selection of the grouping mode and current duration for the sub-conductors are discussed, and the control scheme of the de-icing method by transferred current is established. The control scheme is preliminarily validated by laboratory investigations conducted in an artificial climate chamber. The results can serve as a reference for obtaining the ice-melting scheme when de-icing via the transferred current of bundled conductors.
Keywords
de-icing; overhead line conductors; bundled subconductors; climate chamber; control scheme; critical ice-melting current; de-icing method; heat balance equation; ice-melting time; line de-icing; line impedance modulation; power grid reliability; smart switching modules; transferred current;
fLanguage
English
Journal_Title
Generation, Transmission Distribution, IET
Publisher
iet
ISSN
1751-8687
Type
jour
DOI
10.1049/iet-gtd.2015.0196
Filename
7328444
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