Title :
Analysis of Far-Out Spurious Noise and its Reduction in Envelope-Tracking Power Amplifier
Author :
Jooseung Kim ; Dongsu Kim ; Yunsung Cho ; Daehyun Kang ; Byungjoon Park ; Kyunghoon Moon ; Bumman Kim
Author_Institution :
Dept. of Electr. Eng., Pohang Univ. of Sci. & Technol., Pohang, South Korea
Abstract :
This paper describes analysis of the far-out spurious noise and a method to reduce this noise in an envelope-tracking power amplifier (ET PA). The ET PA delivers a higher efficiency and a better linearity than the stand-alone PA, simultaneously. However, the ET PA generates spectral regrowth at a far-out spurious emission domain. The noise sources are analyzed, and the noise effects on a RF PA are estimated using mathematical models of the RF PA and supply modulator. To reduce the noise, a wideband supply modulator is designed using 40-nm CMOS process for a high speed operation, and an additional capacitor is connected to the supply line of the PA. These noise reduction techniques significantly reduce the far-out spurious noise of the ET PA to a level similar to that of the stand-alone PA. For a 10-MHz bandwidth and 6.5-dB peak-to-average power ratio long term evolution signal, the ET PA delivers a power-added efficiency of 41.8%, a gain of 23.8 dB, and an evolved universal terrestrial radio access adjacent channel leakage ratio of -34.3 dBc at an average output power of 27 dBm and an operating frequency of 1.85 GHz. The noise power spectrum densities of the ET PA are -130.3/-133.7 dBm/Hz at 1.93/1.99 GHz, respectively, which is limited by our PA itself.
Keywords :
CMOS analogue integrated circuits; UHF integrated circuits; UHF power amplifiers; CMOS process; ET PA; bandwidth 10 MHz; capacitor; efficiency 41.8 percent; envelope-tracking power amplifier; far-out spurious emission domain; far-out spurious noise analysis; far-out spurious noise reduction techniques; frequency 1.85 GHz; frequency 1.93 GHz; frequency 1.99 GHz; gain 23.8 dB; mathematical models; noise effects; noise power spectrum; peak-to-average power ratio Long Term Evolution signal; size 40 nm; spectral regrowth; supply modulator; universal terrestrial radio access adjacent channel leakage ratio; wideband supply modulator; Distortion; Frequency modulation; Mathematical model; Radio frequency; Regulators; Switches; Envelope-tracking; far-out spurious noise; long term evolution (LTE); power amplifier; receiver band noise (RxBN); supply modulator;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2015.2495178